InP indium phosphide

As one of the most important compound semiconductor materials, InP indium phosphide single crystal material is the key material for the production of InP-based laser diodes (LDs), light-emitting diodes (LEDs) and photodetectors in optical communications. These devices realize optical fiber communications. Information transmission, dissemination, amplification, reception and other functions.

Product Description

As one of the most important compound semiconductor materials, InP indium phosphide single crystal material is the key material for the production of InP-based laser diodes (LDs), light-emitting diodes (LEDs) and photodetectors in optical communications. These devices realize optical fiber communications. Information transmission, dissemination, amplification, reception and other functions.

InP is also very suitable for high-frequency devices, such as high electron mobility transistor (HEMT) and heterojunction bipolar transistor (HBT), etc. Due to its superior characteristics, it is used in optical fiber communication, microwave, millimeter wave, anti- Radiation solar cells, heterojunction transistors and many other high-tech fields have a wide range of applications .

The main growth methods of InP single crystal materials include traditional liquid seal Czochralski technology (LEC), improved LEC technology, gas pressure controlled Czochralski technology (VCZ/PC-LEC)/vertical gradient solidification technology (VGF)/vertical bridge Man Technology (VB), etc.


Product parameters

single crystaldopingconductivity typeCarrier concentrationcm-3Mobility (cm2/Vs)Dislocation density (cm-2)standard substrate
InPIntrinsicN(0.4-2) x 10 16(3.5-4) x 10 3£ 5 x 10 4Φ2″×0.35mmΦ3″×0.35mm
InPSN(0.8-3) x 10 18(4-6)´10 18(2.0-2.4) x 10 3(1.3-1.6) x 10 3£ 3 x 10 4£ 2 x 10 3Φ2″×0.35mmΦ3″×0.35mm
InPZnP(0.6-2) x 10 1870-90£ 2 x 10 4Φ2″×0.35mmΦ3″×0.35mm
InPTeN107-10 8³ 2000£ 3 x 10 4Φ2″×0.35mmΦ3″×0.35mm
Dimensions (mm)Dia50.8x0.35mm, 10×10×0.35mm, 10×5×0.35mm can be customized for   special substrates
structureCubic, a=5.869 Aa=5.869A
crystal direction<100>
melting pointoC1600℃
densityg/cm34.79 g/ cm3
Bandgap width1.344
Surface roughnessRa:≦ 1nm
  can provide atomic particle microscope (AFM) test report
polishingsingle or double sided
PackageClass 100 clean bag, Class 1000 ultra-clean room

 


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